Semiconductor Material And Device Characterization
By: Schroder, Dieter K.
Material type:
BookSeries: A Wiley Interscience Publication. Publisher: New York ; John Wiley & Sons ; 1998Edition: 2.Description: xxiv;760; hb; 6.5x9.5.ISBN: 0471241393.DDC classification: 621.38152 |
| Item type | Current location | Call number | Copy number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
| 621.38152/Sch (Browse shelf) | 1 | Available | 13981 |
Total holds: 0
Browsing HBCSE Shelves Close shelf browser
| No cover image available | No cover image available |
|
|
No cover image available |
|
No cover image available | ||
| 621.381528/Wor World Transistor Equivalents And Data | 621.381528/Wor World Transistor Equivalents And Data | 621.38152/Gha Vlsi Fabrication Principles : Silicon And Gallium Arsenide | 621.38152/Sch Semiconductor Material And Device Characterization | 621.38152/Sem Semiconductors : Data Manual | 621.38152/Wei/Vin Quantum Semiconductor Structures : Fundamentals And Applications | 621.3815322/Gen Semiconductor Controlled Rectifiers : Principles And Applications Of P-N-P-N Devices |
There are no comments for this item.