| 000 | 00603nam a2200253Ia 4500 | ||
|---|---|---|---|
| 008 | 140520s9999||||xx |||||||||||||| ||und|| | ||
| 020 | _a0471241393 | ||
| 082 | _a621.38152 | ||
| 082 | _bSch | ||
| 100 | _aSchroder, Dieter K. | ||
| 245 | _aSemiconductor Material And Device Characterization | ||
| 250 | _a2 | ||
| 260 | _aNew York | ||
| 260 | _bJohn Wiley & Sons | ||
| 260 | _c1998 | ||
| 300 | _axxiv;760 | ||
| 300 | _bhb | ||
| 300 | _c6.5x9.5 | ||
| 350 | _a131.93 | ||
| 365 | _b5462.73 | ||
| 365 | _dDollars | ||
| 440 | _aA Wiley Interscience Publication | ||
| 923 | _n46500 / 23-06-05 | ||
| 999 |
_c70148 _d70148 |
||